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CONTV-PT0. 2N m, 13kHz, PtIr Conductive Coating, PtIr Reflective Coating, 10 Pack DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS A pack of Conductive Silicon Probes. Bruker's Value Line Probe for Electrical Characterization using Contact Mode in air. Specifications: Tip radius of 25 nm nominal. Platinum Iridium coated, electrically conductive tip that is ideal for various electrical characterization applications. The Pt Ir coating on the front side

and contact mode

Reflective coatings are recommended for thin cantilevers

The modulus of this sample and its variation over time are only approximately known

and nanoindentation

Consistently high enhancement (proprietary optimized fabrication)

Bruker's Value Line Probe for Electrical Characterization using Contact Mode in air

8 Cantilever Geometry: Rectangular Cantilevers Number: 1

nanoscratching

Scanning Thermal Microscopy probes are specially designed contact mode probes that incorporate a thin metal film near the apex of the probe

- Unmounted for use on any AFM

this ispushing the limits of 3D-AFM technology for measuring tight dimensionsand extending its capability for future nodes

ReactivationREQUIRES purchase of the full PeakForce QNM package (MM-PFQNM