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SHR75High Resolution Force Modulation AFM Probe DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS High Resolution Force Modulation AFM Probe Single carbon spike on silicon apex! The SHR75 is based on BudgetSensors' well established Multi75GB G probe and it is suitable for high resolution light tapping mode operation. The SHR75 probe has a single hydrophobic diamond like carbon extratip at the apex of Gold coated silicon etched probe. There are no

707A 115mm carbon fiber reinforced PVDF 0

and stitching images with minimal focus change between stage moves

Special ZEISS/LEO SEM Pin Stub Mount

Wafer Cleaving / Glass Breaking Pliers - Wafer Cleaving / Glass Breaking Pliers

PELCO® Pro Gold Plated Tweezers

Monocrystalline diamonds tend to have longer

Stainless Steel

Hole size in the top and base is ø2

5 Cantilever Geometry: Rectangular Cantilevers Number: 1 Front Side Coating: Conductive PtSi Back Side Coating: Reflective Al

Probes can be heated repeatedly and reliably to higher temperatures (350°C) than other thermal probes made of thin metal films

5N/m - From 3N/m To 12N/m Resonance Frequency 19kHz - From 16kHz To 24kHz Resonance Frequency 110 - From 80kHz To 140kHz Length 500µm - From 490µm To 510µm Length 210µm - From 200µm To 220µm Width 30µm - From 25µm To 35µm Width 30µm - From 25µm To 35µm Thickness 2

stainless steel and 4-40 x 3/8 flat head screw

Exchange/Return Notes