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Description

NM-RCDESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Nanomechanics Probe, 350 N m, 750kHz, 10nm ROC, 5 Pack. Uncalibrated. These tips are specifically designed for high mechanical loads and scratch testing applications. By using wear resistant diamond and a broad cone angle the contact size is well characterized and stays constant during repeated mechanical measurements. These probes have demonstrated highly repeatable deep (~100nm) indentations

Highly static sensitive

• Improved probe quality & aesthetics

depending on contact radius measured on a silver surface

Test sample for TERS at 633 nm excitation

Proprietary Reflex Coating

Sharpened Silicon Tip

With precisely controlled cantilever geometry to enable repeatable scanning parameters

· A blend of Polystyrene and Polyolefin Elastomer (ethylene-octene copolymer) are spin-cast onto a silicon substrate

Resonant frequency 55 kHz in air

This remarkable development leverages Brukers exclusive ScanAsyst® Self-Optimizing Atomic Force Microscopy Imaging Mode

A two-component polymer sample mounted on a 12mm steel sample puck for training researchers in the use of HarmoniX mode

They are not certified or traceable to NIST